Area measurement crystals grown from the liquid melt using the Czochralski method, based on the control-circuit conditions contact sensor liquid level
Sergey Pavlovich Sahanskiy
Abstract
For crystals grown from the liquid melt using the Czochralski method, the mathematical model of the current control chip area by controlling the conditions of the contact sensor circuit level of the melt in the crucible, which allows to calculate the control signal, as the difference between the current and the target area grown crystals.